| Mfg Part Number: 15-1326286-1 | Alternate P/N: 1513262861 |
| Manufacturer: Gte Corp | NSN : 5962-01-375-7492 |
| NIIN : 013757492 | Item Name : microcircuit memory |
| CAGE Code : 0BDC6 | FSC : 5962 Microcircuits Electronic |
Thank you for your interest in our available 15-1326286-1 NSN part. This part number 15-1326286-1 is a Microcircuit Memory listed under the FSC 5962 Microcircuits Electronic, and it is manufactured by Gte Corp. At Internet of Components, all of our stock and inventory are available for purchase today, ready to ship with short lead times and competitive pricing. Whether you are in need of parts that are new, used, or obsolete, our team of industry experts is readily available 24/7x365 to fulfill all of your operational
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| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-375-7492 Item Description: Microcircuit Memory | 5962 | 013757492 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 15-1326286-1 | 5 | 2 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| AGAV | End Item Identification | HAC/RMPE REACT BASIC |
| NHCF | Nuclear Hardness Critical Feature | HARDENED |
| CZZZ | Memory Capacity | 128K X 8 |
| CTQX | Current Rating Per Characteristic | 5.00 MICROAMPERES MAXIMUM INPUT |
| CBBL | Features Provided | BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND RADIATION HARDENED AND ULTRAVIOLET ERASABLE AND TESTED TO MIL-STD-883 AND SELECTED ITEM |
| CZER | Memory Device Type | EPROM |
| AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
| TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| ADAT | Body Width | 0.585 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
| FEAT | Special Features | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; SELECTED FROM P/N 5962-8961404MXX OR 5962-8961405MXX,CAGE 67268 |
| SPCL | Special Test Features | SELECTED AND TESTED FOR RADIATION HARDNESS |
| CQSZ | Inclosure Configuration | DUAL-IN-LINE |
| ADAQ | Body Length | 1.660 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
| AEHX | Maximum Power Dissipation Rating | 330.0 MILLIWATTS |
| ADAU | Body Height | 0.200 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
| CZEN | Voltage Rating And Type Per Characteristic | -0.6 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| TTQY | Terminal Type And Quantity | 32 PRINTED CIRCUIT |
| CQSJ | Inclosure Material | CERAMIC |
| CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT,PROM,128K X 8 (27C010); MICROCIRCUIT,MEMORY DIGITAL,CMOS 128K X 8-BIT UVEPROM,MONOLITHIC SILICON |
| MRC | Decoded Requirement | Clear Text Reply |
| AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
| CWSG | Terminal Surface Treatment | SOLDER |
| CZEQ | Time Rating Per Chacteristic | 150.00 NANOSECONDS MINIMUM ACCESS AND 170.00 NANOSECONDS MAXIMUM ACCESS |
| CQWX | Output Logic Form | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CRTL | Criticality Code Justification | FEAT |
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